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IP Theft Investigation Article Published in PI Magazine (written by Ron Alvarez)

The July/August 2017, issue of PI Magazine includes a feature article written by Ron Alvarez, titled, “Investigating Intellectual Property (IP) Theft.”

The article takes a broad look at the IP theft problem from defining IP; explaining the magnitude of this global phenomenon; giving a counterfeit case study; providing some statistics on the China counterfeit anomaly; to recommendations for brand owners in using IP-PIs; as well as providing IP infringement and protection educational resources for brand protection professionals and investigators.

Link to PI Magazine…
https://www.pimagazine.com/

 

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Ron Alvarez is an IP Investigations / Protection writer and licensed private investigator in New York City. He is a former NYPD lieutenant where he investigated robbery, narcotics, internal affairs, and fine art theft cases. Ron is a graduate of the FBI National Academy and earned a B.A. in Government and Public Administration from John Jay College of Criminal Justice in Manhattan. He has published a number of articles on various investigative topics for PI Magazine. Ron is certified by the Interpol-International IP Crime Investigators College (IIPCIC.) as a "Transnational and Organized Crime Intellectual Property (IP) Investigator."

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